NEWS


July 14, 2008
Metrosol Introduced The Metrosolver Software Environment for Use With The VUV-7000 Optical Metrology System ...read more

July 8, 2008
Metrosol Hires 17-Year Semiconductor Industry Veteran, Sean Jameson, as Vice President of Sales ...read more

March 31, 2008
Metrosol Teams With John P. Kummer Group To Expand European Presence ...read more

March 24, 2008
Metrosol Teams With ASYST Technologies To Provide Industry-Leading, Global Support For Its VUV Metrology Tools ...read more

February 27, 2008
Metrosol Teams With Extended Enterprise Partner Owens Design To Speed Product Development, Enhance Performance and Reduce Costs ...read more

February 20 , 2008
Metrosol Teams With SemiTorr To Provide Technical Sales Support For Its VUV Metrology Tools...read more

December 3, 2007
Metrosol Teams With Inabata To Introduce Production-Worthy VUV Metrology Tool To Japanese Semiconductor Industry At Semicon Japan...read more

September 26, 2007
Metrosol Work with SEMATECH Validates Capability to Measure Film Thickness and Composition Simultaneously...read more

July 17, 2007
Metrosol Introduces Its Patented Production-Worthy VUV Optical Measurement Technology at SEMICON West ...read more

July 17, 2007
Metrosol Introduces ES-7000 VUV Fab Metrology Tool Capable of Measuring Both Film Thickness and Composition At 45 nm and Below ...read more

January 2, 2007
Metrosol Appoints New CEO in Preparation for Next Growth Phase...read more

July 10, 2006
Metrosol Accesses Shorter Wavelengths to Provide
Fast, Ultrathin Film Characterization...read more

June 15, 2006
Metrosol Short Wavelength Optical Metrology Receives 2006
SEMICON West Technology Innovation Showcase (TIS) Award...read more


TRADESHOWS & CONFERENCES

Please visit us at the following events:

July 15-17, 2008
SEMICON West 2008
Booth 6742, North Hall
Moscone Center
San Francisco, CA